Coating Thickness Gauge LEPTOSKOP 2042
Product Description
Depending on the probe, the hand-held device with the clearly arranged display determines the thickness of non-magnetic layers on magnetizable substrates (according to DIN EN ISO 2178) and the thickness of non-conductive layers on non-magnetic, conductive base material using the eddy current principle (according to DIN EN ISO 2360).
External probes are available from a large variety of models, so the most diverse testing problems can be solved.
Key Facts
- Wide range of calibration options
- Variable display modes for optimal adaptation to the measuring task*
- Limit value input and monitoring*
- Measured value storage* with easy-to-handle file management as under Windows
- Wide range of statistical evaluation options
- Data transfer to Windows programs optionally with the PC programs iCom or EasyExport
* depending on the expansion stage
Versions
LEPTOSKOP 2042 (order no.: 2042.001)
Device expansion stages
- Module „Statistics“ (order no.: 2911.001)
- Module „Statistics and Data Memory“ (order no.: 2911.002)
Standard packages
- Fe Basic Package (order no.: 2042.901)
- NFe basic package (order no.: 2042.902)
- Fe/NFE basic package (order no.: 2042.904)
Statistics packages
- Statistics package Fe (order no.: 2042.911)
- Statistics package NFe (order no.: 2042.912)
- Combination Fe/NFe Statistics Package (order no.: 2042.914)
Data packages
- Data package Fe (order no.: 2042.921)
- Data package NFe (order no.: 2042.922)
- Combination data package Fe/NFe (order no.: 2042.924)
The LEPTOSKOP 2042 in a rugged protective case
Further Information
Our comprehensive brochure:
Things to know and accessories:
